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Electron Microscopy and Analysis for Materials Research


Technical University of Denmark


General course objectives:
The course aims at providing a basic theoretical understanding of the principles of electron microscopy, with special emphasis on analysis of crystalline materials. Therefore, prior basic knowledge of crystallography and crystal defects is essential in this course. The course will enable the participants to understand and interpret electron microscopy images, diffraction patterns and energy dispersive spectroscopy data obtained using scanning and transmission electron microscopes. Specimens analyzed during the course will represent metals and alloys. The course is recommended for PhD students. Active learning will be applied in this course.

Learning objectives:
A student who has met the objectives of the course will be able to:
  • Recognise the main components of electron microscopes
  • Describe the interaction of electrons with solid matter and differentiate between elastic and inelastic interactions
  • Describe the types of electron signals that result from these interactions and the principles of detection for different signals
  • Interpret energy dispersive spectroscopy (EDS) data
  • Interpret variations in contrast and intensity in images of the microstructure taken in the scanning electron microscope (SEM) and in the transmission electron microscope (TEM)
  • Analyse electron diffraction effects and patterns in both SEM and TEM
  • Evaluate the relevance of available electron microscopy techniques for a chosen project
  • Formulate strategies for specimen preparation, observations and analysis for a specific project

Contents:
This course introduces electron microscopy as a method for characterizing the microstructure, crystallographic orientations and local chemistry of metals and alloys. Students will learn the operating principles of the transmission and scanning electron microscopes, and how to obtain and interpret images, diffraction patterns and energy dispersive spectroscopy data. In addition, each student will be involved in practical work using at least one of the electron microscopy techniques. This form of study will involve discussion with and guidance from a member of DTU staff. Topics will include: • Main components of electron microscopes • Interaction of electrons with solid matter • Electron detection for different signals and image formation in TEM and SEM • Different types of TEM contrast (diffraction contrast, mass-thickness contrast, phase contrast) • Imaging TEM techniques (bright-field, dark-field, high-resolution) • Spectroscopic methods • Diffraction patterns in TEM and SEM (EBSD) • Specimen preparation for TEM and SEM

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Course organizer
Oleg , Jakob Birkedal
Place/Venue
Anker Engelunds Vej 1
City
2800 Kgs. Lyngby
Country
Denmark
Workload
5
Link
http://kurser.dtu.dk/course/41690