Electron Spectroscopy
Tampere University
Core content
· Surface analysis and surface sensitivity: Principles of surface analytical research. Instrumentation. Surface sensitivity. Attenuation length and information depth. Application examples of surface analysis.
· X-ray photoelectron spectroscopy (XPS): Spectral features and chemical shifts. XPS as an analytical method. Quantitative analysis.
· Auger electron spectroscopy (AES): Auger-transition. AES as an analytical method. Comparison of XPS and AES methods. Depth profiling. Quantitative analysis.
· Ultra-violet photoemission spectroscopy (UPS): Photon sources and surface sensitivity of UPS. Orientation and symmetry of adsorbed molecules.
· X-ray absorption spectroscopy (XAS): Synchrotron radiation and surface science. NEXAFS and EXAFS methods.
Complementary knowledge
· Vacuum technology. Energy analysers. Role of emission angle to information depth.
· Photon sources. X-ray lines and X-ray satellites. Three-step model of photoemission. Adiabatic approximation. Koopman's theorem.
· X-ray fluorescence yield versus Auger electron yield. Energy of the Auger transition.
· Fermi's Golden Rule. Dipole matrix element. Character table. Polarization. Surface molecule point groups. Polarization-dependent selection rules.
· Analysis of EXAFS spectrum.
Specialist knowledge
· Concentric Hemispherical Analyser. Spectromicroscopy.
· Intrinsic and extrinsic processes of photoemission. Many-electron effects in photoemission. Nanostructures on surfaces.
· Carbon KVV-transition. Ionisation cross-section.
· ARUPS CO/Ni(100).
· XAS of Cu oxides.
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