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Advanced Materials Characterization


Tampere University


Core content · (Scanning) transmission electron microscopy (S/TEM) with microanalysis and special techniques · Focused ion beam (FIB) technique · Electron backscatter diffraction (EBSD) methods · Atomic force microscopy (AFM) · Raman spectroscopy · Digital image correlation (DIC) methods · Micro-/nanomechanics · Advanced X-ray diffraction (XRD) techniques

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Place/Venue
City
Country
Finland
Workload
5cr
Link
https://www.tuni.fi/en/students-guide/curricu...